# Assertion (A): Shot noise is due to random variations in current flow in active devices. Reason (R): Current is a flow of carriers each of which carri

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Assertion (A): Shot noise is due to random variations in current flow in active devices.

Reason (R): Current is a flow of carriers each of which carries a finite amount of charge.

1. Both (A) and (R) are true and (R) is the correct explanation of (A)
2. Both (A) and (R) are true, but (R) is not the correct explanation of (A)
3. (A) is true, but (R) is false
4. (A) is false, but (R) is true

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Correct Answer - Option 1 : Both (A) and (R) are true and (R) is the correct explanation of (A)

Shot noise: It is a type of noise that appears in all amplifying & active devices.

• It is associated with a current flow
• In semiconductor devices, shot Noise is due to the random variation in the diffusion of minority carriers
• Current is a flow of carriers each of which carriers a finite amount of charge.
• For diodes, the exact expression for RMS shot noise $I_n^2 = 2\;{I_{dC}}qB$

∴ Both (A) & (R) are true & (R) is the correct explanation of (A)